Earth and Environmental Sciences (SEES)
Scanning Electron Microscope
The SEES scanning electron microscope (SEM) is a Jeol JSM-6100 unit with electron backscatter and EDX capability. Operating voltages are between 5 and 35 kV, and the unit has a large specimen chamber with a three-dimensional tilting stage, allowing for greater flexibility of specimen sizes and analyses. Image capture and analysis are performed using a PC digitiser and 'SemAfore' software.