Earth and Environmental Sciences (SEES)

Scanning Electron Microscope

Scanning Electron Microscope (667x250)The SEES scanning electron microscope (SEM) is a Jeol JSM-6100 unit with electron backscatter and EDX capability.  Operating voltages are between 5 and 35 kV, and the unit has a large specimen chamber with a three-dimensional tilting stage, allowing for greater flexibility of specimen sizes and analyses.  Image capture and analysis are performed using a PC digitiser and 'SemAfore' software. 

Enquiries regarding the SEM should be directed to Dr Anthony Butcher -anthony.butcher@port.ac.uk